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インデックス
Micro-Nano Materials Characterization and Inspection- Evaluation of Electrical Properties-
Outline
Outline
Introduction
Introduction
Conductivity measurement of metallic nanowires
Geometry (cross-section shape) of nanowires
Geometry (cross-section shape) of nanowires
Measuring the dimensions of nanowires
Measuring the resistance of nanowires
Measuring the resistance of nanowires
Determining the grain size of nanowires
Outline
The advantage of four-point probe method
The advantage of four-point probe method
Modified four-point probe method
Outline
Four-point AFM probe method
Fabrication of four-point AFM probe
Fabrication of four-point AFM probe
A nanowire sample and its AFM image
A nanowire sample and its AFM image
Measuring the conductivity of nanowire
Measuring the conductivity of nanowire
Measuring the conductivity of nanowire
Outline
Microwave AFM Method
Microwave AFM Method
Microwave AFM Method
Fabricating the Tip of M-AFM Probe
Fabrication of M-AFM Probe
Fabrication of M-AFM Probe
Fabrication of M-AFM Probe
Fabrication of M-AFM Probe
Measuring Topography by M-AFM Probe
Measuring Topography by M-AFM Probe
Connection of the fabricated probe and a microwave source
Measurement Using M-AFM
Microwave Image Obtained by M-AFM
Measurement of Electrical Properties by M-AFM
Measurement of Electrical Properties by M-AFM
Measurement of Electrical Properties by M-AFM
Measurement of Electrical Properties by M-AFM
Measurement of Electrical Properties by M-AFM
Measurement of Electrical Properties by M-AFM
Measurement of Electrical Properties by M-AFM
Measurement of Electrical Properties by M-AFM